Search results for "Scanning confocal electron microscopy"

A Scanning Electron Microscope for Ultracold Atoms

2006

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.

The future of transmission electron microscopy (TEM) in biology and medicine.

2000

1996

The uses of atomic force microscopy, scanning tunneling microscopy, electron spectroscopic imaging, electron energy loss spectroscopy and low voltage, high resolution scanning electron microscopy in polymer research are reviewed

Optical sectioning by two-pinhole confocal fluorescence microscopy.

2003

A two-pinhole axially superresolving confocal fluorescence imaging system is presented. Based on the concept of subtractive incoherent imaging, the system described here is equipped with a zero-focus complex-transmittance pupil filter in one of the collector paths. The optical sectioning capacity of the system is 25% superior to that of a free-pupil one-pinhole instrument.

Photonic nanopatterns of gold nanostructures indicate the excitation of surface plasmon modes of a wavelength of 50-100 nm by scanning near-field opt…

2003

Scanning near-field optical microscopy images of metal nanostructures taken with the tetrahedral tip (T-tip) show a distribution of dark and bright spots at distances in the order of 25-50 nm. The images are interpreted as photonic nanopatterns defined as calculated scanning near-field optical microscopy images using a dipole serving as a light-emitting scanning near-field optical microscopy probe. Changing from a positive to a negative value of the dielectric function of a sample leads to the partition of one spot into several spots in the photonic nanopatterns, indicating the excitation of surface plasmons of a wavelength in the order of 50-100 nm in metal nanostructures.

Scanning probe microscopies applied to the study of the domain wall in a ferroelectric crystal.

2007

Summary Scanning near-field optical microscopy is capable of measuring the topography and optical signals at the same time. This fact makes this technique a valuable tool in the study of materials at nanometric scale and, in particular, of ferroelectric materials, as it permits the study of their domains structure without the need of chemical etching and, therefore, not damaging the surface (as will be demonstrated later). We have measured the scanning near-field optical microscopy transmission, as well as the topography, of an RbTiOPO4 single crystalline slab, which exhibits two different of macroscopic ferroelectric domains. A chemical selective etching has been performed to distinguish b…

Visualization of Molecular Recognition Events on Microstructured Lipid-Membrane Compartments by In Situ Scanning Force Microscopy This work was suppo…

2002

Tunable optical sectioning in confocal microscopy by use of symmetrical defocusing and apodization

2008

We present two novel optical methods to achieve a significative improvement in the optical-sectioning capacity of confocal scanning microscopes. The techniques, whose real power is the simplicity with which they can be implemented, consist of a suitable combination of symmetrical defocusing with two different manners of apodizing both parts of the confocal architecture. It is shown that the proposed techniques are useful in both the bright-field and the fluorescence modes and for reflection and transmission geometries.

Subtractive imaging in confocal scanning microscopy using a CCD camera as a detector

2012

[EN] We report a scheme for the detector system of confocal microscopes in which the pinhole and a large-area detector are substituted by a CCD camera. The numerical integration of the intensities acquired by the active pixels emulates the signal passing through the pinhole. We demonstrate the imaging capability and the optical sectioning of the system. Subtractive-imaging confocal microscopy can be implemented in a simple manner, providing superresolution and improving optical sectioning. (C) 2012 Optical Society of America

Incremental lines in root cementum of human teeth: an approach to their ultrastructural nature by microscopy.

1998

In ground sections of human teeth, root cementum shows under the light microscope as alternating, almost concentric, dark and light rings. In paleontology and forensic medicine, the number of these incremental lines or annulations is used to derive the age-at-death of the individual. To find the ultrastructural features underlying these cemental annulations, we used bright-field light microscopy (LM), confocal laser scanning microscopy (CLSM), transmission electron microscopy (TEM), and electron-dispersive x-radiation (EDX) in a scanning electron microscope (SEM). Annulations visible in ground sections of about 100-μm thickness were no longer visible in semi-thin sections (thickness, 1-2 μ…